Presenter

Qiang Xu is an Associate Professor of Computer Science & Engineering at The Chinese University of Hong Kong. He received his B.E. and M.E. degrees in Telecommunication Engineering from Beijing University of Posts & Telecommunications, China, in 1997 and 2000, respectively. After working at a start-up integrated circuit design house for one and a half years, he continued his graduate study and received his Ph.D. degree in Electrical & Computer Engineering from McMaster University, Canada, in 2005, and then joined CUHK.

Dr. Xu leads the CUhk REliable computing laboratory (CURE Lab.) and CUHK MakerLab. His research interests include fault-tolerant computing, trusted computing and smart hardware design. He received the Best Paper Award in 2004 IEEE/ACM Design, Automation and Test in Europe (DATE). He has five other papers nominated for best paper award at prestigious conferences (e.g., DAC and ICCAD).

Dr. Xu is currently serving as an associate editor for IEEE Design&Test. He has also served as technical program committee members for a number of conferences on VLSI design and testing, including DAC, ITC, ICCAD, and DATE.