Joon-Sung Yang received the B.S. degree from Yonsei University, Seoul, Korea, in 2003, and the M.S. and Ph.D. degrees from the University of Texas at Austin, Austin, Texas, in 2007 and 2009, respectively, all in electrical and computer engineering. After graduation, he worked in Intel Corporation for 4 years. He is currently an associate professor at Yonsei University in Korea. Before joining Yonsei University, he was an associate professor at Sungkyunkwan University. His research interests include deep learning, intelligent design methodologies and system reliability in emerging architectures. He was a recipient of Korea Science and Engineering Foundation (KOSEF) Scholarship in 2005. He received a Best Paper Award at 2008 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems and at 2016 IEEE International SoC Design Conference, an A. Richard Newton Young Student Fellow Advisor Award at 2018 Design Automation Conference (DAC) and was nominated for Best Paper Award at 2013 IEEE VLSI Test Symposium. He is a senior member of the IEEE.
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