Keunsoo Lee received the B.E. degree and the M.S. degree in electrical and electronics engineering from the Yonsei University, Seoul, Korea, in 2009 and 2011, respectively.
He joined the Design Technology Team, System LSI Business, Samsung Electronics, Korea, in 2011. His current research interests include design for testability, automatic test pattern generation, path-delay defects detection, and SRAM memory built-in self-test.
Designer, IP and Embedded Systems Track Presentations
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