Liang Chen received the B.E. degree in electromagnetic field and wireless technology from Northwestern Polytechnical University, Xi’an, China, in 2015. He is currently pursuing the Ph.D. degree in electronic science and technology at Shanghai Jiao Tong University, Shanghai, China.
He is currently a Visiting Student with VLSI System and Computation Lab, Department of Electrical and Computer Engineering, University of California at Riverside, Riverside, CA, USA.
Manufacturing Test and Reliability