Presenter

Hussam Amrouch(S'11-M'15) is a Junior Professor for the Semiconductor Test and Reliability (STAR) chair within the Computer Science, Electrical Engineering Faculty at the University of Stuttgart as well as a Research Group Leader at the Karlsruhe Institute of Technology (KIT), Germany. He received his Ph.D. degree with distinction (Summa cum laude) from KIT in 2015. His main research interests are design for reliability and testing from device physics to systems, machine learning, security, approximate computing, and emerging technologies with a special focus on ferroelectric devices. He holds seven HiPEAC Paper Awards and three best paper nominations at top EDA conferences: DAC'16, DAC'17 and DATE'17 for his work on reliability. He currently serves as Associate Editor at Integration, the VLSI Journal. He has served in the technical program committees of many major EDA conferences such as DAC, ASP-DAC, ICCAD, etc. and as a reviewer in many top journals like T-ED, TCAS-I, TVLSI, TCAD, TC, etc. He has around 110 publications in multidisciplinary research areas across the entire computing stack, starting from semiconductor physics to circuit design all the way up to computer-aided design and computer architecture.