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DTSTAMP:20211208T164412Z
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DTSTART;TZID=America/Los_Angeles:20211208T153000
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UID:dac_DAC 2021_sess134_RESEARCH979@linklings.com
SUMMARY:Reversible Gating Architecture for Rare Failure Detection of Analo
 g and Mixed-Signal Circuits
DESCRIPTION:Research Manuscript\n\nReversible Gating Architecture for Rare
  Failure Detection of Analog and Mixed-Signal Circuits\n\nHu\n\nDue to the
  expensive simulation and manufacturing cost in analog and mixed-signal (A
 MS) circuit design, AMS failure detection in high-dimensional variational 
 space is demanding with limited samples. In this work, we propose a revers
 ible gating architecture to identify essential features from datasets and 
 reduce feature dimension for the failure detection. Through reversible res
 idual networks (RevNets) for their restoration ability from output to inpu
 t without loss of information, the proposed gating architecture is incorpo
 rated into Bayesian optimization (BO) framework to reduce the dimensionali
 ty of BO embedding important features. Furthermore, two restoration scheme
 s in the RevNet are explored for efficient dimension reduction.\n\nTopic: 
 EDA\n\nKeyword: Manufacturing Test and Reliability\n\nVirtual Program: Pre
 sented In-Person
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