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Research Manuscript: Deep Learn Your Yield
Event TypeResearch Manuscript
Virtual Programs
Hosted in Virtual Platform
Keywords
Physical Design and Verification, Lithography and DFM
Topics
EDA
Time
Location
DescriptionWondering how to improve your manufacturability and yield at sub-5nm? These four papers bring the best of deep learning technologies and creative approaches to transfer learn layout pattern generations, attack data imbalance, insert SRAFs and accelerate dummy fill computation.