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Session

Research Manuscript: Reliability from Fab to Mission
Event TypeResearch Manuscript
Virtual Programs
Presented In-Person
Keywords
Manufacturing Test and Reliability
Topics
EDA
TimeWednesday, December 8th3:30pm - 5:00pm PST
Location3018
DescriptionAs CMOS scaling continues deeper into the nanometer scale and new device technologies proliferate to enhance performance, reliability of products through their lifetime is an increasing concern. This session presents analysis and mitigation methods to prevent and detect wearout based failures for a variety of technologies, ranging from analog, digital, and mixed signal devices to memristors.